Near-Field-Scanning-Optical-Microscopy (NSOM) System


Our deep UV femtosecond laser is also integrated with a UV NSOM/AFM system for imaging optical patterns with a spatial resoultion of 100 nm. The NSOM/AFM system is also capable of imaging non-destructively semiconductor film resistivity, capacitance, and defects with a 100 nm spacial resolution.


Below: near field microscope